- Microstructure and Electrical Properties of W-doped $ extrm{TiO}_2$
- ㆍ 저자명
- 백승봉,이순일,김명호,Baek. Seung-Bong,Lee. Sun-Il,Kim. Myeong-Ho
- ㆍ 간행물명
- 한국재료학회지
- ㆍ 권/호정보
- 1999년|9권 1호|pp.57-64 (8 pages)
- ㆍ 발행정보
- 한국재료학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
The electrical conductivity of TiO$_2$ doped with 0.05~1.5mol% WO$_3$ was measured in the oxygen partial pressure range of 10ulcorner~10ulcorner atm and temperature range of 1100~130$0^{circ}C$ to investigate the defect types and the electrical properties. The grain size and density were increased as the liquid phase was formed by the doped WO$_3$. The secondary phase and WO$_3$peaks at the sample doped up to 4.0 mol% were not detected from the XRD results. The data(log$sigma$/logPo$_2$) over 110$0^{circ}C$ were divided into the four regions. From these experimental results, we proposed the following defect regions. 1) Magneli phase(extended defect), 2) Reduced rutile region which is similar to the behavior of undoped rutile, 3) Nearly stoichiometric TiulcornerWulcornerO$_2$region in which extra charge of Wulcorner cation is expected to be compensated by an electron, 4) Overstoichiometric TiulcornerWulcornerOulcorner region which is a metal deficiency not to be observed in pure TiO$_2$. The electrical conductivity of w-doped TiO$_2$ was influenced by the measuring temperature, oxygen partial pressure, and the dopig content.