Life test is performed to set a confidence (lower) limit on the mean or median life of items if the number of failures at the end of the fixed time t does not exceed a given number c. Gupta(1962) propose a sampling plan for truncated life tests when the life distribution of an item is normal or lognormal distribution. In this paper, based on the result of Gupta(1962), we propose a sampling plan for failure rate test when an item has normal or lognormal life distribution. We assume that the shape parameter is known while the location parameter is unknown.