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Location Error Analysis of an Active RFID-Based RTLS in Multipath and AWGN Environments
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  • Location Error Analysis of an Active RFID-Based RTLS in Multipath and AWGN Environments
  • Location Error Analysis of an Active RFID-Based RTLS in Multipath and AWGN Environments
저자명
Myong. Seung-Il,Mo. Sang-Hyun,Yang. Hoe-Sung,Cha. Jong-Sub,Lee. Heyung-Sub,Seo. Dong-Sun
간행물명
ETRI journal
권/호정보
2011년|33권 4호|pp.528-536 (9 pages)
발행정보
한국전자통신연구원
파일정보
정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

In this paper, we analyze the location accuracy of real-time locating systems (RTLSs) in multipath environments in which the RTLSs comply with the ISO/IEC 24730-2 international standard. To analyze the location error of RTLS in multipath environments, we consider a direct path and indirect path, in which time and phase are delayed, and also white Gaussian noise is added. The location error depends strongly on both the noise level and phase difference under a low signal-to-noise ratio (SNR) regime, but only on the noise level under a high SNR regime. The phase difference effect can be minimized by matching it to the time delay difference at a ratio of 180 degrees per 1 chip time delay (Tc). At a relatively high SNR of 10 dB, a location error of less than 3 m is expected at any phase and time delay value of an indirect signal. At a low SNR regime, the location error range increases to 8.1 m at a 0.5 Tc, and to 7.3 m at a 1.5 Tc. However, if the correlation energy is accumulated for an 8-bit period, the location error can be reduced to 3.9 m and 2.5 m, respectively.