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Experimental Investigations for Thermal Mutual Evaluation in Multi-Chip Modules
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  • Experimental Investigations for Thermal Mutual Evaluation in Multi-Chip Modules
  • Experimental Investigations for Thermal Mutual Evaluation in Multi-Chip Modules
저자명
Ayadi. Moez,Bouguezzi. Sihem,Ghariani. Moez,Neji. Rafik
간행물명
Journal of power electronics : JPE
권/호정보
2014년|14권 6호|pp.1345-1356 (12 pages)
발행정보
전력전자학회
파일정보
정기간행물|ENG|
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기타
이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
서지반출

기타언어초록

The thermal behavior of power modules is an important criterion for the design of cooling systems and optimum thermal structure of these modules. An important consideration for high power and high frequency design is the spacing between semiconductor devices, substrate structure and influence of the boundary condition in the case. This study focuses on the thermal behavior of hybrid power modules to establish a simplified method that allows temperature estimation in different module components without decapsulation. This study resulted in a correction of the junction temperature values estimated from the transient thermal impedance of each component operating alone. The corrections depend on mutual thermal coupling between different chips of the hybrid structure. A new experimental technique for thermal mutual evaluation is presented. Notably, the classic analysis of thermal phenomena in these structures, which was independent of dissipated power magnitude and boundary conditions in the case, is incorrect.