Image processin software is developed to get spot intensity form the frame of a LEEd pattern obtained by using a CCD Camera and a frame grabber. Imporved algorithm for more reasonable background substraction is implemented in this software . I/V Charateristicsof some spots form Cu(001) suface are collected . These results are compared with those of Davis and Noonan and found to be consistent with the latter results. This software is also applied to meausre RHEEd spot intensity oscillatin, and gives clear oscillations very easily.