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SURFACE ROUGHNESS EFFECTS ON THE COERCIVITY OF THIN FILM HEADS
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  • SURFACE ROUGHNESS EFFECTS ON THE COERCIVITY OF THIN FILM HEADS
  • SURFACE ROUGHNESS EFFECTS ON THE COERCIVITY OF THIN FILM HEADS
저자명
Kim. Hyunkyu,Horvath. M. Pardavi
간행물명
韓國磁氣學會誌
권/호정보
1995년|5권 5호|pp.663-666 (4 pages)
발행정보
한국자기학회
파일정보
정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

The domain wall motion coercivity, $H_{c}$, of magnetic materials arises from the dependence of the wall energy on localized changes in material parameters (magnetization, anisotropy, exchange energy densities). However, in an otherwise perfectly homogeneous material, the domain wall energy might change due to the change in the volume of the wall versus the wall position. Thus, any surface roughness contributes to the coercivity. Assuming different two-dimensional surface profiles, characterized by average wavelengths ${lambda}_{x}$ and ${lambda}_{y}$, and relative thickness variations dh/h, the coercivity due to the surface roughness has been calculated. Compared to the one dimensional case, the 2D coercivity is reduced. Depending on the ratio of ${lambda}$ to the domain wall width, $H_{c}$ has a maximum around 2, and increasing with dh/h. With the decreasing thickness of the thin film and GMR heads, it might be the domain factor in determining the coercivity.