Crystalline structure induced effecs on the ferroelectric and current conduction properties in electron beam deposited PZT thin films are described. $TiO_2$ dispersion in PZT reduces dielectric constant and charge storage density to 270 and $3.5;{mu}C/cm^2$ and increases carrier density. Pyrochlore PZT inclusion cause further reduction to 60 and $77fC/cm^2$ but have no effect on the microscpic polarization. Activated conduction energy 0.25-0.3eV is observed in $TiO_2$ mixed PZT. Low field conduction is ohmic and changes to space charge limited at a threshold field $8{ imes}10^4;V/cm$. Inclusion of pyrochlore phase causes deep traps ${ hickapprox}5{ imes}10^18cm^-3$ and increased hole density of ${ hickapprox};3{ imes}10^11;cm^-3$.