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SMD의 위치와 방향 계산 및 검사 알고리듬 : 형태학적 방법과 Hough 변환 방법의 비교
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  • SMD의 위치와 방향 계산 및 검사 알고리듬 : 형태학적 방법과 Hough 변환 방법의 비교
  • Positioning and Inspection of SMD : Comparison of Morphological Method and Hough Transform Method
저자명
권준식,최종수
간행물명
電子工學會論文誌. Journal of the Korea institute of telematics and electronics. B
권/호정보
1995년|1호|pp.73-84 (12 pages)
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대한전자공학회
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

New morphological positioning algorithm and inspection method are presented and compared with a method by means of the Hough transform. The positioning algorithm is the process of finding the center and the rotated angle of the surface mounted device (SMD). The inspection method is capable of detecting the location of broken or bent leads. In order to obtain the center and the orientation of the SMD rapidly, the Hough transform method utilizes feature points (concave points) and is executed on a DSP board. The proposed morphological method is implemented by using the morphological skeleton subsets, and an ultimate orientation is decided by the Hit-or-Miss transform (HMT). In the inspection process, two inspection methods also are presented. The first method utilizes the morphological methods, i.e., opening and closing. It is performed before the positioning process and called an initial inspection. The second method follows the positioning process and is performed by an inspection of intersections of rulers and the lead edge (or the skeleton). It is a ruling technique which is referred to as a detailed inspection. We find the morphological approach is preciser and faster than the Hough approach by the comparison of the proposed algorithms.