This paper presents a statistical process control(SPC) system in the electronic parts manufacturing process. In this system, an SPC method is integrated into the automated inspection technology on a real time base. It shows how the collected data can be analyzed with the SPC to provide process information. also presented are stuided of subpixel image processing technology to improve the accuracy of parts mearements , and the cumulative-sum(CUSUM) control chart for fraction defectives.An application of the developed system to connector manufacturing process as a part of computer integrated manufacturing (CIM) is presented.