- 방사온도계에 의한 칩 형태 인식
- ㆍ 저자명
- Kweon. H.J.,Paik. I.H.,Sim. J.H.
- ㆍ 간행물명
- 한국정밀공학회지
- ㆍ 권/호정보
- 1996년|13권 7호|pp.59-65 (7 pages)
- ㆍ 발행정보
- 한국정밀공학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
A major problem in automation of turning operations is the difficulty in obtaining a sufficient and reliable chip control. Therefore it becomes desirable to find a method which can detect the chip form. Newly born chips in usual metal cutting radiate infrared rays. When such chips run out of cutting point quickly, the radiated energy from the zone around the tool is low compared with that of the case when long tangled chips are staying around the tool. The difference in chip pattern can be detected from the output of pyrometer. But, strictly speaking, only the output of pyrometer does not identify the chip form because that is the removal of chip. Therefore, in this paper, a method of the identification of chip form using output of pyrometer and fuzzy inference is developed.