We have constructed a scanning confocal microscope using a 780 nm semiconductor laser, an actuator of a compact disk player and a quad-detector. This device detects heights and characteristics of a surface. The laser focus was located at the surface of a sample by using the error signal obtained by a quad-dector, and the current supplied to the actuator for lens was displayed as a height. The materials of a surface were classified according to reflected total intensities and was displayed by different color in a monitor. The device has very samll dimensions of 30 mm$ imes$20 mm$ imes$20 mm and scan field is 1.6 mm$ imes$1.6mm. We obtained two images, one using only reflected light and the other using an error signal from a quad-detector and compared these two images.