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Test Sequence Generation Using Multiple Unique State Signature(MUSS)
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  • Test Sequence Generation Using Multiple Unique State Signature(MUSS)
저자명
Jung. Yoon-Hee,Hong. Beom-Kee
간행물명
Journal of electrical engineering and information science
권/호정보
1997년|2권 6호|pp.43-47 (5 pages)
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한국정보과학회
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
서지반출

기타언어초록

A procedure presented in this paper generates test sequences to check the conformity of an implementation with a protocol specification, which is modeled as a deterministic finite state machine (FSM). Given a FSM, a common procedure of test sequence generation, first, constructs a directed graph which edges include the state check after each transition, and produces a symmetric graph G* from and, finally, finds a Euler tour of G*. We propose a technique to determine a minimum-cost tour of the transition graph of the FSM. The proposed technique using Multiple Unique State Signature (MUSS) solves an open issue that one MUIO sequence assignment may lead to two more edges of unit cost being replicated to from G* while an optimal assignment may lead to the replication of a single edge of high cost. In this paper, randomly generated FSMs have been studied as test cases. The result shows that the proposed technique saves the cost 4∼28% and 2∼21% over the previous approach using MUIO and MUSP, respectively.