Previous VSI control chart works have been done on quality variable whose distribution is normal. But there are many situations in which hte assumption of not a, pp.opriate. Also, in many industrial processes, the interest is to monitor the number of defectives. In this paper, we will take the existing properties of VSI control chart developed for the normal distribution and a, pp.y them to the np-chart based on the discrete binomial distribution. We will consider the CUSUM chart for the number of defectives. Here, the interesting object is to compute the VSI ATS for CUSUM control chart using Markov chain a, pp.oach and to compare FSI ATS and VSI ATS.