The requirements of the accuracy, the high speed and the stability are very important factors in the defect-detection sytem for the texture. In this paper, we describe a novel scheme of the defect detection using a statistical behavior of defect patterns. Some prior knowledge as to the characteristics of flaws is that the defects are consistently distributed in the space and the noise are randomly generated. An empirical knowledge is adapted for the binarization and the determination process of defects in textured image. Since the process of the determination exclude the segmentations or delineation steps, we are able to meet the speed requirements. We show the validity of the scheme through the simulation of textured images.