- 자동 시각 검사를 위한 개선된 서브픽셀 알고리즘
- ㆍ 저자명
- 장동식,이만희,김길동,Jang. Dong-Sik,Lee. Man-Hee,Kim. Gil-Dong
- ㆍ 간행물명
- 산업공학
- ㆍ 권/호정보
- 1998년|11권 3호|pp.15-22 (8 pages)
- ㆍ 발행정보
- 대한산업공학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
A new improved algorithm in edge location to subpixel accuracy using decent-based weight to spatial information is proposed in this paper and applied to automated visual inspection(AVI) system. An application of the new edge operator as an edge detector is also provided and compared with Tabatabai and Lyvers edge detectors. The existing algorithms located edger to subpixel accuracy using least-square or moment-based methods. The algorithms also use only spatial information or grey-level values to locate edges. However, the proposed algorithm consider the weighted sum of grey-levels values of each edge pattern. The results show that the proposed algorithm is relatively less biased and has smaller standard deviation than the edge operations developed by Tabatabai and Lyvers in the presence of noise.