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Critical Current Degradation Analysis in HTS Pancake Coil due to Self Field Effects
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  • Critical Current Degradation Analysis in HTS Pancake Coil due to Self Field Effects
  • Critical Current Degradation Analysis in HTS Pancake Coil due to Self Field Effects
저자명
Nah. Wan-Soo,Joo. Jin-Ho,Yoo. Jai-Moo
간행물명
Progress in superconductivity
권/호정보
1999년|1권 1호|pp.68-72 (5 pages)
발행정보
한국초전도학회
파일정보
정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

Since the discovery of high Tc superconductors, great efforts have been focused to develop high performance HTS magnets for the ultimate applications to power system devices. Magnet designers, however, have had difficulties in the estimation of the maximum operating current of the designed magnet from the tested short sample data, due to the degradation of the critical current density in the magnet. Similar story applies to the HTS electrical bus bar. It has been found that the critical current of Bi-2223 stacked tapes is much less than the total summation of critical currents of each tape, which is mainly attributed to the self magnetic fields. Furthermore, since the critical current degradation of Bi-2223 tape is greater in the normal magnetic field (to the tape surface) than in the parallel one, detailed magnetic field configurations are required to reduce the self field effects. In this paper, we calculate the self field effects of a stacked conductor, defining self field factors of normal and parallel magnetic fields to the tape surface. Finally, the critical current degradations in the HTS magnet are explained by the introduced self field factors of the stacked conductor.