[$Moiracute{e}$] technique is now being extensively investigated as a fast non-contact means of three-dimensional profile measurement especially for reverse engineering. One problem with $moiracute{e}$ technique is so called $2pi$-ambiguity problem that limits the maximum step height difference between two neighboring sampling points to be less than half the equivalent wavelength of $moiracute{e}$ fringes. In this investigation, a new two-wavelength scheme of projection $moiracute{e}$ topography is proposed and tested to cope with the $2pi$-ambiguity problem. Experimental results are discussed to assess the new method in measuring large objects with high step discontinuities.