LaSrCoO3 thin films were spin-coated onto the SrTiO3(100) substrates by the chemical solution process. X-ray diffraction $ heta$-2$ heta$ scans and X-ray diffraction $eta$ scans were used to determine the crystallinity and in -plane alignment behavior of the films. The X-ray diffraction pattern showed the film obtained by annealing at 80$0^{circ}C$ was highly oriented. The X-ray diffraction pole-figure analysis and reciprocal-space mapping (2$ heta$-$Delta$$omega$ scans) of the resulting film showed that the film comprising the pseduocubic phase had an epitaxial relationship with the SriO3 substrate.