- Monitoring and Characterization of Bacterial Contamination in a High-Purity Water System Used for Semiconductor Manufacturing
- Monitoring and Characterization of Bacterial Contamination in a High-Purity Water System Used for Semiconductor Manufacturing
- ㆍ 저자명
- Kim. In -Seop,Lee. Geon-Hyoung,Lee. Kye-Joon
- ㆍ 간행물명
- The journal of microbiology
- ㆍ 권/호정보
- 2000년|38권 2호|pp.99-104 (6 pages)
- ㆍ 발행정보
- 한국미생물학회
- ㆍ 파일정보
- 정기간행물|ENG| PDF텍스트
- ㆍ 주제분야
- 기타
