Recent studies have shown that the $ar{X}$ chart with variable sampling intervals(VSI) and the $ar{X}$ chart with variable sample size(VSS) are much quicker than Shewhart $ar{X}$ chart in detecting shiks in the process. Shewhart $ar{X}$ chart has been beneficial to detect large shifts but it is hard to apply Shewhart $ar{X}$ chart in detecting moderate shifts in the process mean. In this article the $ar{X}$ chart using variable sample size(VSS) and variable sampling Intervals(VSI) has been proposed to supplement the weak point mentioned above. So the purpose of this paper is to consider finding the design parameters which minimize expected loss costs for unit process time and measure the performance of VSSI(variable sample size and sampling interval) $ar{X}$ chart. It is important that assignable causes be detected to maintain the process controlled. This paper has been studied under the assumption that one cycle is from starting of the process to eliminating the assignable causes in the process. The other purpose of this article is to represent the expected loss costs in one cycle with three process parameters(sample size, sampling interval and control limits) function and find the three parameters.