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CMP (Chemical Mechanical Polishing) characteristics of langasite single crystals for SAW filter applications
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  • CMP (Chemical Mechanical Polishing) characteristics of langasite single crystals for SAW filter applications
  • CMP (Chemical Mechanical Polishing) characteristics of langasite single crystals for SAW filter applications
저자명
Jang. Min-Chul,An. Jin-Ho,Kim. Jong-Cheol,Auh. Keun-Ho
간행물명
한국결정성장학회지
권/호정보
2000년|10권 4호|pp.309-317 (9 pages)
발행정보
한국결정성장학회
파일정보
정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

Langasite is a promising new piezoelectric material for SAW filter application. Little was known until recently about the methods needed to mechanically polish and chemically polish/etch this material. In this experiment, polishing, slurry chemistry and chemical wet etching for langasite is described. Conventional quartz and LN ($LiNbO_3$) polishing methods did not produce satisfactory polished surfaces, and polishing with a colloidal silica slurries has shown to be most effective. The optimum condition was investigated by changing the slurry chemistry. As the planarization effect is very important in SAW filter applications, the examination of the effective particle number effect and the particle size effect was carried out. Z-cut langasite surface which had been polished with the colloidal silica slurries was etched in a variety of etchants. Conventional quartz etchants destroyed the polished surface. Other etchants formed a thin film on the surfaces. In this experiment, the reaction between langasite and a few etching solution was analysed. And an appropriate selective etchant solution for analyzing the defects was synthesized.