As the high density memory is widely used in the various applications, the need for reproduction of memory is increased. In this paper we propose an efficient fault diagnosis algorithm of linear order O(n) that enables the reproduction of memory. The new algorithm can distinguish various fault models and identify all the cells related to the faults. In addition, a new BIST architecture for fault diagnosis is developed. Using the new algorithm, fault diagnosis can be performed efficiently. And the performance evaluation with previous approaches proves the efficiency of the new algorithm.