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Surface Analysis of Plasma-treated PDMS by XPS and Surface Voltage Decay
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  • Surface Analysis of Plasma-treated PDMS by XPS and Surface Voltage Decay
  • Surface Analysis of Plasma-treated PDMS by XPS and Surface Voltage Decay
저자명
Youn. Bok-Hee,Park. Chung-Ryul,Kim. Nam-Ryul,Seo. Yu-Jin,Huh. Chang-Su,Lee. Ki-Taek
간행물명
Transactions on electrical and electronic materials
권/호정보
2002년|3권 4호|pp.10-15 (6 pages)
발행정보
한국전기전자재료학회
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정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

Surface states of polydimethylsiloxane (PDMS) treated by plasma were investigated by the analysis by x-ray photoelectron spectroscopy (XPS) and surface voltage decay. Plasma treatment causes the silica-like(SiO$\_$x/, x=3∼4) oxidative layer, which is confirmed with XPS, and lowers surface resistivity from 1.78$ imes$1014 Ω/square to 1.09$ imes$10$^$13/ Ω/square with increasing the plasma treatment time. By measuring the decay time constant of surface voltage, the calculated surface resistivity was compared with the value directly measured by a voltage-current method, so good agreement between two methods was obtained. It was observed that the plasma treatment led to decrease of the thermal activation energy of the surface conduction from 31.0 kJ/mol of untreated specimen to 21.8 kJ/mol. It is found that our results allow the examination of effects of plasma on electrical properties of PDMS.