Degradation data can provide more reliability information than traditional failure-time data, especially products with few or no failures. This paper is concerned with a method of estimating lifetime distribution from field data with supplementary information on degradation data and covariates. When a distribution of degradation rate obtained by follow-up study for a portion of products that survive after-warranty follows a reciprocal-Weibull or lognormal distribution. A time-to-failure distribution of the product follows Weibull or lognormal distribution, respectively. A method of estimating lifetime parameters for this kind of data and their asymptotic properties are studied. Effects of after-warranty report probability, follow-up rate, and proportion of degradation data on pseudo maximum likelihood estimators of these parameters are investigated.