- AR(l) 공정을 탐지하는 VSS $overline{A}$ 관리도의 통계적 설계
- ㆍ 저자명
- 이재헌
- ㆍ 간행물명
- 品質經營學會誌
- ㆍ 권/호정보
- 2003년|31권 3호|pp.126-135 (10 pages)
- ㆍ 발행정보
- 한국품질경영학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
A basic assumption in standard applications of control charts is that the observations are statistically independent. However, this assumption is often violated from processes in many industries. The presence of autocorrelation has a serious impact on the performance of control charts, causing a dramatic increase in the frequency of false alarms. This paper considers a process in which the observations can be modeled as a first order autoregressive(AR(1)) process, and develops (equation omitted) charts with the variable sample size(VSS) scheme for monitoring the mean of this process.