Life time data analysis requires some time-to-failure data to an extent. Some life tests result in few or no failure. In such cases, it is difficult to access reliability with traditional life tests that record only time to failure. Furthermore, with short product development time, reliability tests must be conducted with severe time constraints. For some devices, it is possible to obtain degradation measurements over time, and these measurements may contain useful information about product reliability. This article describes degradation reliability analysis methods to do inferences and predictions about a failure-time distribution by using software. In addition, the possibility of extension to CBM (Condition Based Maintenance) is suggested as an example of applied degradation data analysis.