The values of crystalline-electric-field parameters $A_{nm}$ for $RFe_{11}$Ti $H_{x}$ (R=Tb,Ho) (x=0,l) are obtained by fitting calculations to the magnetization curves along the crystal axes at 4.2 K and higher temperatures. The insertion of H element in RFe$_{11}$Ti significantly affects CEF parameters $A_{nm}$ . By using exchange field 2${mu}$$_{B}$ $H_{ex}$ derived by inelastic neutron scattering and fitted $A_{nm}$ , the calculations reproduce the experimental curves well.