We have carried out a basic experiment in order to develope a super high-resolution optical microscope which transcend the limitation of diffraction and the wavelength of lightwave. The image of this scope is composed by measuring the evanescent wave which is localized on the surface of the testing materials. A detecting probe was fabricated with a single mode optical fiber to be sharpened by the chemical etching, and drived by PZT. The standing wave of $0.33mu extrm{m}$ wavelength evanescent wave which was generated from the $0.78mu extrm{m}$-wavelength semiconductor laser was detected by the $0.5mu extrm{m}$-thickness optical fiber probe.