The microstructure and microwave dielectric properties of $(1-x){Mg}_4{Ta}_2{O}_9-xTi{O}_2(x=0sim0.9)$ ceramics were investigated. The specimens were prepared by the conventional mixed oxide method with sintering temperature of 140$0^{circ}C$∼150$0^{circ}C$. To improve the quality factor and the temperature coefficient of resonant frequency,$ Ti{O}_2(varepsilonGamma=100, Q imes f_Gamma=40,000 GHz, a_f= +450 ppmdiagup^{circ}C $ was added in ${Mg}_4{Ta}_2{O}_9$ceramics. The dielectric and structural properties were investigated. According to the XRD patterns, $(1-x){Mg}_4{Ta}_2{O}_9-xTi{O}_2(x=0sim0.9)$ ceramics had the ${Mg}_4{Ta}_2{O}_9$ phase(hexagonal) and ${MgTi}_2{O}_5$phase(orthorhombic). The dielectric constant($varepsilon_r$). quality($Qtimes{f}_r$