- 알곤저온플라즈마처리된 고분자표면의 모폴로지에 대한 비교연구
- ㆍ 저자명
- 서은덕,Seo. Eun-Deock
- ㆍ 간행물명
- 韓國染色加工學會誌
- ㆍ 권/호정보
- 2004년|16권 5호|pp.35-41 (7 pages)
- ㆍ 발행정보
- 한국염색가공학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
Poly(ethylene terephthalate), polyimide(Kapton), and polypropylene surfaces were modified with argon low temperature plasma by RF glow discharge at 240m Torr, 40W to investigate the surface morphological changes due to the plasma treatment using atomic force microscopy(AFM). Analysis of the AFM images and Ra(average roughness) revealed that the plasma treatment resulted in significant ablation on the surfaces. The morphological changes and surface roughness, however, were different depending on material characteristics such as heat stability, presence of amorphous region, swelling phenomenon, and molecular structure of repeating unit. It was assumed that polypropylene due to its tertiary hydrogen was ablated easily compared to poly(ethylene terephthalate), and that polyimide was more resistant to the ablation than PET due to rigid skeleton of imide and stable phenyl ring structure.