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PDP ITO 패턴유리의 결함 검사시스템 개발
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  • PDP ITO 패턴유리의 결함 검사시스템 개발
저자명
송준엽,박화영,김현종,정연욱,Song. Jun Yeob,Park. Hwa Young,Kim. Hyun Jong,Jung. Yeon Wook
간행물명
한국정밀공학회지
권/호정보
2004년|21권 12호|pp.92-99 (8 pages)
발행정보
한국정밀공학회
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정기간행물|
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기타
이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

The formation degree of sustain (ITO pattern) decides quality of PDP (Plasma Display Panel). For this reason, it makes efforts in searching defects more than 30 un as 100%. Now, the existing inspection is dependent upon naked eye or microscope in off-line PDP manufacturing process. In this study developed prototype inspection system of PDP 170 glass is based on line-scan mechanism. Developed system creates information that detects and sorts kinds of defect automatically. Designed inspection technology adopts multi-vision method by slip-beam formation for the minimum of inspection time and detection algorithm is embodied in detection ability of developed system. Designed algorithm had to make good use of kernel matrix that draws up an approach to geometry. A characteristic of defects, as pin hole, substance, protrusion, are extracted from blob analysis method. Defects, as open, short, spots and et al, are distinguished by line type inspection algorithm. In experiment, we could have ensured ability of inspection that can be detected with reliability of up to 95% in about 60 seconds.