- PIC Controller를 이용한 키패드 검사 시스템 개발
- ㆍ 저자명
- 최광훈,이영춘,권대규,이성철,Choi. Kwang-Hoon,Lee. Young-Choon,Kwon. Tae-Kyu,Lee. Seong-Cheol
- ㆍ 간행물명
- 한국정밀공학회지
- ㆍ 권/호정보
- 2004년|21권 10호|pp.94-101 (8 pages)
- ㆍ 발행정보
- 한국정밀공학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
This paper presents the development of a keypad test system for the improvement of working environment and productivity using PTC 16F877 microprocessor. In order to detect the fault of keypad products, hardware and software design is performed in this system. Keypad fault detection system is controlled by the 8 bit one chip PIC microcontroller for the exactness and speed. Developed panel of the keypad test system is comprised of the sub-panel for selecting in the inspected keypad types and the main panel f3r displaying the working order and fault position. Furthermore, all data from keypad inspection are stored in main memory of personal computer for the database. All these functions lead to the improvement of working speed and environment.