NiO thickness dependences of perpendicular magnetic anisotropy (PMA) in the $NiO/[CoFe/Pt]_5$ multilayers for exchange biasing and $[CoFe/Pt]_4/Pt/[CoFe/Pt]_4$ for interlayer exchange coupling were investigated. Perpendicular magnetization curve was obtained by out-of-plane extraordinary Hall measurement. Magnetic force microscopy (MFM) has been used for the investigation of magnetic domains on thin films. We confirmed that the interlayer exchange coupling (IEC) as a function of NiO thickness at room temperature existed with a period of two monolayers.???? 0???ㅘ