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Structural Properties of PZT(80/20) Thick Films Fabricated by Screen Printing Method
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  • Structural Properties of PZT(80/20) Thick Films Fabricated by Screen Printing Method
  • Structural Properties of PZT(80/20) Thick Films Fabricated by Screen Printing Method
저자명
Lee. Sung-Gap,Lee. Young-Hie
간행물명
Transactions on electrical and electronic materials
권/호정보
2005년|6권 2호|pp.35-38 (4 pages)
발행정보
한국전기전자재료학회
파일정보
정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

Pb(Zr$_{0.8}$Ti$_{0.2}$)O$_{3}$ powders, prepared by the sol-gel method, were mixed with an organic vehicle and the PZT thick films were fabricated by the screen-printing techniques on Pt/Ah03 substrates. The structural properties were examined as a function of sintering temperature. The particle size distribution of the PZT powder derived from the sol-gel process is uniform with the mean particle size of about 2.6 m. As a result of the DTA, the formation of the polycrystalline perovskite phase was observed at around $890^{circ}$CC. In the X-ray diffraction analysis, all PZT thick films showed a perovskite polycrystalline structure without a pyrochlore phase. The perovskite crystallization temperature of PZT thick films was about $890^{circ}$C. The average thickness of the PZT thick films was approximately 80-90 m.