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저자명
최규식,김용경,Che. Gyu-Shik,Kim. Yong-Kyung
간행물명
Journal of information technology applications & management
권/호정보
2005년|12권 2호|pp.1-13 (13 pages)
발행정보
한국데이타베이스학회
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

This paper proposes a software-reliability growth model incoporating the amount of testing effort expended during the software testing phase after developing it. The time-dependent behavior of testing effort expenditures is described by a Logistic curve. Assuming that the error detection rate to the amount of testing effort spent during the testing phase is proportional to the current error content, a software-reliability growth model is formulated by a nonhomogeneous Poisson process. Using this model the method of data analysis for software reliability measurement is developed. After defining a software reliability, This paper discusses the relations between testing time and reliability and between duration following failure fixing and reliability are studied. SRGM in several literatures has used the exponential curve, Railleigh curve or Weibull curve as an amount of testing effort during software testing phase. However, it might not be appropriate to represent the consumption curve for testing effort by one of already proposed curves in some software development environments. Therefore, this paper shows that a logistic testing-effort function can be adequately expressed as a software development/testing effort curve and that it gives a good predictive capability based on real failure data.