- $TiO_2$ 함량에 따른 $P_2O_5-ZnO$계와 $SiO_2-ZnO-B_2O_3$계 유전체의 반사 및 유전특성
- ㆍ 저자명
- 류부형,권순석,Ryu. Boo-Hyung,Kwon. Soon-Suk
- ㆍ 간행물명
- 한국안전학회지
- ㆍ 권/호정보
- 2005년|20권 4호|pp.29-33 (5 pages)
- ㆍ 발행정보
- 한국안전학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
In this paper, reflectance and the dielectric characteristics for $P_2O_5-ZnO-BaO$ system and $SiO_2-ZnO-B_2O_3$ system have been investigated as a function of contents of $TiO_2$. The reflectance was decreased with increasing the contents of $TiO_2$ and the reflectance of $P_2O_5-ZnO-BaO$ system was lowered than that of $SiO_2-ZnO-B_2O_3$ system. The dielectric constant of $P_2O_5-ZnO-BaO$ system was higher than $SiO_2-ZnO-B_2O_3$ system, and the dielectric constant in the both system was increased with increasing of $TiO_2$ contents. This can be explained as the space charge effects. These results are could be applied to the under plate dielectrics of PDP required high reflective ratio and breakdown strength.