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The Electrical Properties of Single-silicon TFT Structure with Symmetric Dual-Gate for kink effect suppression
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  • The Electrical Properties of Single-silicon TFT Structure with Symmetric Dual-Gate for kink effect suppression
  • The Electrical Properties of Single-silicon TFT Structure with Symmetric Dual-Gate for kink effect suppression
저자명
이덕진,강이구,Lee. Deok-Jin,Kang. Ey-Goo
간행물명
컴퓨터産業敎育學會論文誌
권/호정보
2005년|6권 5호|pp.783-790 (8 pages)
발행정보
한국컴퓨터산업교육학회
파일정보
정기간행물|ENG|
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기타
이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

In this paper, we have simulated a Symmetric Dual-gate Single-Si TFT which has three split floating n+ zones. This structure reduces the kink-effect drastically and improves the on-current. Due to the separated floating n+ zones, the transistor channel region is split into four zones with different lengths defined by a floating n+ region, This structure allows an effective reduction of the kink-effect depending on the length of two sub-channels. The on-current of the proposed dual-gate structure is 0.9mA while that of the conventional dual-gate structure is 0.5mA at a 12V drain voltage and a 7V gate voltage. This result shows a 80% enhancement in on-current. Moreover we observed the reduction of electric field in the channel region compared to conventional single-gate TFT and the reduction of the output conductance in the saturation region. In addition, we also confirmed the reduction of hole concentration in the channel region so that the kink-effect reduces effectively.