In this paper, a simple but fast and reliable technique for the complex dielectric constant measurement of non-magnetic materials is introduced using a measured transmission coefficient (S21) and a genetic algorithm as an inversion process at microwave frequencies. In this experiment, it has been found that the transmission method is less susceptible with the measurement errors than that of the reflection method and the genetic algorithm can be efficiently used as a search technique. The suggested technique is validated with known and unknown conductor-loaded lossy materials and the conductor-loaded PCB at X-band.