- Annealing Temperature Dependence of Exchange Bias Effect in Short Time Annealed NiFe/NiMn Bilayer Thin Film by FMR Measurement
- Annealing Temperature Dependence of Exchange Bias Effect in Short Time Annealed NiFe/NiMn Bilayer Thin Film by FMR Measurement
- ㆍ 저자명
- Yoo. Yong-Goo,Park. Nam-Seok,Min. Seong-Gi,Yu. Seong-Cho
- ㆍ 간행물명
- Journal of magnetics
- ㆍ 권/호정보
- 2005년|10권 4호|pp.133-136 (4 pages)
- ㆍ 발행정보
- 한국자기학회
- ㆍ 파일정보
- 정기간행물|ENG| PDF텍스트
- ㆍ 주제분야
- 기타
