- Analysis of the Influence of the Address Electrode Width on High-speed Addressing Using the Vt Close Curve and Dynamic Vdata Margin
- Analysis of the Influence of the Address Electrode Width on High-speed Addressing Using the Vt Close Curve and Dynamic Vdata Margin
- ㆍ 저자명
- Kim. Yong-Duk,Park. Se-Kwang
- ㆍ 간행물명
- KIEE international transactions on electrophysics and applications
- ㆍ 권/호정보
- 2005년|5호|pp.183-190 (8 pages)
- ㆍ 발행정보
- 대한전기학회
- ㆍ 파일정보
- 정기간행물|ENG| PDF텍스트
- ㆍ 주제분야
- 기타
