As an alternative to traditional life testing, degradation tests can be effective in assessing product reliability when measurements of degradation leading to failure can be observed. This article presents an accelerated degradation testing for vacuum fluorescent displays (VFDs). The accelerated degradation model is based on Arrhenius-lifetime relationship for cathode temperatures. We compare the results between accelerated degradation test and test at normal use condition. Accelerated degradation test for display devices is observed as an efficient method to warrantee product reliability to customers, as well as a tool to save time and costs.