Estimations of the parameters included in a two-component system are derived based on masked system life test data, when the probability of masking depends upon the exact cause of system failure. Also estimations of reliability for the individual components at a specified mission time are derived. Maximum likelihood and Bayes methods are used to derive these estimators. The problem is explained on a series system consisting of two independent components each of which has a Pareto distributed lifetime. Further we present numerical studies using simulation.