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CMP에서의 스틱-슬립 마찰특성에 관한 연구
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  • CMP에서의 스틱-슬립 마찰특성에 관한 연구
저자명
이현섭,박범영,서헌덕,박기현,정해도,Lee. Hyunseop,Park. Boumyoung,Seo. Heondeok,Park. Kihyun,Jeong. Haedo
간행물명
전기전자재료학회논문지
권/호정보
2005년|18권 4호|pp.313-320 (8 pages)
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한국전기전자재료학회
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

Stick-slip friction is one of the material removal mechanisms in tribology. It occurs when the static friction force is larger than the dynamic friction force, and make the friction curve fluctuated. In the friction monitoring of chemical mechanical polishing(CMP), the friction force also vibrates just as stick-slip friction. In this paper, an attempt to show the similarity between stick-slip friction and the friction of CMP was conducted. The prepared hard pa(IC1000/Suba400 stackedTM) and soft pad(Suba400TM) were tested with SiO₂ slurry. The friction force was measured by piezoelectric sensor. According to this experiment, it was shown that as the head and table velocity became faster, the stick-slip time shortened because of the change of real contact area. And, the gradient of stick-slip period as a function of head and table speed in soft pad was more precipitous than that of hard one. From these results, it seems that the fluctuating friction force in CMP is stick-slip friction caused by viscoelastic behavior of the pad and the change of real contact area.