- PCB 전기적 신뢰성평가를 위한 이온 마이그레이션 가속시험
- ㆍ 저자명
- 이덕보,김정현,강수근,장석원,임재훈,유동수,Lee. D.B.,Kim. J.H.,Kang. S.K.,Chang. S.W.,Lim. J.H.,Ryu. D.S.
- ㆍ 간행물명
- 한국동력기계공학회지
- ㆍ 권/호정보
- 2005년|9권 1호|pp.64-69 (6 pages)
- ㆍ 발행정보
- 한국동력기계공학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
In evaluation of electronic reliability on the PCB(Print Circuit Borad),electrochemical migration is one of main test objects. The phenomenon of electrochemical migration occurs in the environment of the hight humidity and the hight temperature under bias through a continuous aqueous electrolyte. In this paper, the generating mechanism of electrochemical migration is investigated by using water drop acceleration test under various waters. The waters used in the water drop test are city water, distilled water and ionic water. It found that the generated velocity of electrochemical migration depended on electrolyte quantity which included in the various waters.