To know the structural difference between the ray parenchyma and ray tracheid among Pinus densiflora, Pinus rigida, Pinus koraiensis and Larix kaempferi, an observation was carried out under the FE-SEM. The longest ray parenchyma and ray tracheid were found in Pinus koraiensis species while the shortest ray tracheid and ray parenchyma were found in Pinus densiflora and Larix kaempferi. Larix kaempferi had more than one endwall pit in its ray parenchyma. Pinus densiflora was found highest in the pit aperture diameter in ray tracheid and aperture diameter in the cross-field pit. The pit border width in ray tracheid and lumen diameter of ray parenchyma were found highest in Pinus rigida. The cell wall thickness of ray parenchyma and pit aperture diameter in endwall pit of ray tracheid were found highest in Pinus koraiensis compared to other species.