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Confocal Scanning Microscopy : a High-Resolution Nondestructive Surface Profiler
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  • Confocal Scanning Microscopy : a High-Resolution Nondestructive Surface Profiler
  • Confocal Scanning Microscopy : a High-Resolution Nondestructive Surface Profiler
저자명
Yoo. Hong-Ki,Lee. Seung-Woo,Kang. Dong-Kyun,Kim. Tae-Joong,Gweon. Dae-Gab,Lee. Suk-Won,Kim. Kwang-Soo
간행물명
International journal of precision engineering and manufacturing
권/호정보
2006년|7권 4호|pp.3-7 (5 pages)
발행정보
한국정밀공학회
파일정보
정기간행물|ENG|
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기타
이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

Confocal scanning microscopy is a measurement technique used to observe micrometer and sub-micrometer features due to its high resolution, nondestructive properties, and 3D surface profiling capabilities. The design, implementation, and performance test of a confocal scanning microscopy system are presented in this paper. A short-wavelength laser (405 nm) and an objective lens with a high numerical aperture (0.95) were used to achieve the desired high resolution, while the x- and y-axis scans were implemented using an acousto-optic deflector and galvanomirror, respectively. An objective lens with a piezo-actuator was used to scan the z-axis. A spatial resolution of less than 138 nm was achieved, along with successful 3D surface reconstructions.