We report the random pattern characteristics of the super resolution near field structure(Super-RENS) write once read-many(WORM) disc at a blue laser optical system(laser wavelength 405nm, numerical aperture 0.85) and the Super-RENS read only memory(ROM) disc at a blue laser optical system(laser wavelength 659nm, numerical aperture 0.65). We used the WORM disc of which carrier-to-noise ratio(CNR) of 75nm is 47dB and ROM disc of which carrier-to-noise ratio(CNR) of 173nm is 45dB. We controlled the equalization(EQ) characteristics and used advanced partial-response maximum likelihood(PRML) technique. We obtained bit error rate(bER) of 10-3 level at 50GB WORM disc and bite error rate of 10-4 level at 50GB level ROM disc. This result shows high feasibility of Super-RENS technology for practical use.