- Gd2O2S:Tb의 동시 계수 도플러 양전자 소멸법에 의한 결함 특성
- ㆍ 저자명
- 이종용,배석환,김재홍,권준현,Lee. C.Y.,Bae. S.H.,Kim. J.H.,Kwon. J.H.
- ㆍ 간행물명
- 한국재료학회지
- ㆍ 권/호정보
- 2006년|16권 7호|pp.455-459 (5 pages)
- ㆍ 발행정보
- 한국재료학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
Coincidence Doppler Broadening (CDB) of positron annihilation spectroscopy was applied to analyze defects in the chemical state of Department of Physics, $Gd_2O_2S$:Tb intensifying screens. The screen samples were irradiated by 80 MV X-rays in hospital and were used for 0, 2, 4, and 6 years respectively. There was a positive relationship between the S-parameter values and time of exposure to X-rays. Most of the defects were indicated to have been generated by X-rays. A 1D CDB was developed in order to reduce the background noise, and the S-parameter values of the $Gd_2O_2S$:Tb intensifying screens, using the 1D CDB, varied between 0.4974 and 0.4991.