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Electrical Characteristics of Single-silicon TFT Structure with Symmetric Dual-gate for Kink Effect Suppression
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  • Electrical Characteristics of Single-silicon TFT Structure with Symmetric Dual-gate for Kink Effect Suppression
  • Electrical Characteristics of Single-silicon TFT Structure with Symmetric Dual-gate for Kink Effect Suppression
저자명
Kang. Ey-Goo,Lee. Dae-Yeon,Lee. Chang-Hun,Kim. Chang-Hun,Sung. Man-Young
간행물명
Transactions on electrical and electronic materials
권/호정보
2006년|7권 2호|pp.53-57 (5 pages)
발행정보
한국전기전자재료학회
파일정보
정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

In this paper, a Symmetric Dual-gate Single-Si TFT, which includes three split floating n+ zones, is simulated. This structure drastically reduces the kink-effect and improves the on-current. This is due to the separated floating n+ zones, the transistor channel region is split into four zones with different lengths defined by a floating n+ region. This structure allows effective reduction in the kink-effect, depending on thy length of the two sub-channels. The on-current of the proposed dual-gate structure is 0.9 mA, while that of the conventional dual-gate structure is 0.5 mA, at both 12 V drain and 7 V gate voltages. This result shows an 80% enhancement in on-current. In addition, the reduction of electric field in the channel region compared to a conventional single-gate TFT and the reduction of the output conductance in the saturation region, is observed. In addition, the reduction in hole concentration, in the channel region, in order for effectively reducing the kink-effect, is also confirmed.