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Phase Identification of Nano-Phase Materials using Convergent Beam Electron Diffraction (CBED) Technique
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  • Phase Identification of Nano-Phase Materials using Convergent Beam Electron Diffraction (CBED) Technique
  • Phase Identification of Nano-Phase Materials using Convergent Beam Electron Diffraction (CBED) Technique
저자명
Kim. Gyeung-Ho,Ahn. Jae-Pyoung
간행물명
한국전자현미경학회지
권/호정보
2006년|36권 |pp.47-56 (10 pages)
발행정보
한국현미경학회
파일정보
정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

Improvements are made to existing primitive cell volume measurement method to provide a real-time analysis capability for the phase analysis of nanocrystalline materials. Simplification is introduced in the primitive cell volume calculation leading to fast and reliable method for nano-phase identification and is applied to the phase analysis of Mo-Si-N nanocoating layer. In addition, comparison is made between real-time and film measurements for their accuracy of calculated primitive cell volume values and factors governing the accuracy of the method are determined. About 5% accuracy in primitive cell determination is obtained from camera length calibration and this technique is used to investigate the cell volume variation in WC-TiC core-shell microstructure. In addition to chemical compositional variation in core-shell type structure, primitive cell volume variation reveals additional information on lattice coherency strain across the interface.